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1971 year - 2024 year

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Microwave technology

Nanocrystals in...

Nanocrystals in Non-volatile Memory

Author: Writam Banerjee
Publishing date: 2018
In recent years, utilization of the abundant advantages of quantum physics, quantum dots, quantum wires, quantum wells, and nanocrystals has attracted considerable scientific attention in the field of nonvolatile memory. Nanocrystals are the driving element that have brought the nonvolatile flash memory technology to a distinguished height. However, new approaches are still required to strengthen this technology for future applications. This book details the methods of fabrication of nanocrystals and their application in baseline nonvolatile memory and emerging nonvolatile memory technologies. The chapters have been written by renowned experts of the field and will provide an in-depth understanding of these technologies. The book is a valuable tool for research
786.00 zł
Relativistic Magnetrons

Relativistic Magnetrons

Author: Igor Vintizenko
Igor Vintizenko
Publishing date: 2018
Relativistic high-frequency electronics has now become one of the fastest growing areas of scientific research. This reference is devoted to theoretical and experimental studies of relativistic magnetrons and is written by a leading expert who worked directly on these systems.
974.00 zł
Ternary Alloys Based on...

Ternary Alloys Based on III-V Semiconductors

Author: Vasyl Tomashyk
Publishing date: 2017
This new book covers all known information about phase relations in ternary systems based on III-V semiconductors. It will be of interest to students studying materials science, solid state chemistry, and engineering, in addition to researchers, chemists, and physicists.
1,138.00 zł
The Load-pull Method of RF...

The Load-pull Method of RF and Microwave Power Amplifier Design

Author: John Sevic
Publishing date: 2020
Using the load-pull method for RF and microwave power amplifier design This new book on RF power amplifier design, by industry expert Dr. John F. Sevic, provides comprehensive treatment of RF PA design using the load-pull method, the most widely used and successful method of design. Intended for the newcomer to load-pull, or the seasoned expert, the book presents a systematic method of generation of load-pull contour data, and matching network design, to rapidly produce a RF PA with first-pass success. The method is suitable from HF to millimeter-wave bands, discrete or integrated, and for high-power applications. Those engaged in design or fundamental research will find this book useful, as will the student new to RF and interested in PA design. The author presents
530.00 zł
Wafer-level Testing and...

Wafer-level Testing and Test During Burn-in for Integrated Circuits

Author: Krishnendu Chakrabarty
Sudarshan Bahukudumbi
Publishing date: 2010
Wafer-level testing refers to a critical process of subjecting integrated circuits and semiconductor devices to electrical testing while they are still in wafer form. Burn-in is a temperature/bias reliability stress test used in detecting and screening out potential early life device failures. This hands-on resource provides a comprehensive analysis of these methods, showing how wafer-level testing during burn-in (WLTBI) helps lower product cost in semiconductor manufacturing. Engineers learn how to implement the testing of integrated circuits at the wafer-level under various resource constraints. Moreover, this unique book helps practitioners address the issue of enabling next generation products with previous generation testers. Practitioners also find expert
417.90 zł