Filtruj wg
Filtruj według

Data wydania

1971 rok - 2024 rok

Autor

Dostępność

Cena

0,00 zł - 20 627,00 zł

Czas dostawy

2 dni - 30 dni

Wydawnictwo

Technologia mikrofalowa

Filtruj wg
Sortuj wg:
  • Cena, malejąco
  • Cena, rosnąco
  • Trafność
  • Nazwa, Z do A
  • Nazwa, A do Z

    • Jest 5 produktów.

    Nanocrystals in...

    Nanocrystals in Non-volatile Memory

    Autor: Writam Banerjee
    Data wydania: 2018
    In recent years, utilization of the abundant advantages of quantum physics, quantum dots, quantum wires, quantum wells, and nanocrystals has attracted considerable scientific attention in the field of nonvolatile memory. Nanocrystals are the driving element that have brought the nonvolatile flash memory technology to a distinguished height. However, new approaches are still required to strengthen this technology for future applications. This book details the methods of fabrication of nanocrystals and their application in baseline nonvolatile memory and emerging nonvolatile memory technologies. The chapters have been written by renowned experts of the field and will provide an in-depth understanding of these technologies. The book is a valuable tool for research
    786,00 zł
    • Nowy
    Relativistic Magnetrons

    Relativistic Magnetrons

    Autor: Igor Vintizenko
    Igor Vintizenko
    Data wydania: 2018
    Relativistic high-frequency electronics has now become one of the fastest growing areas of scientific research. This reference is devoted to theoretical and experimental studies of relativistic magnetrons and is written by a leading expert who worked directly on these systems.
    974,00 zł
    • Nowy
    Ternary Alloys Based on...

    Ternary Alloys Based on III-V Semiconductors

    Autor: Vasyl Tomashyk
    Data wydania: 2017
    This new book covers all known information about phase relations in ternary systems based on III-V semiconductors. It will be of interest to students studying materials science, solid state chemistry, and engineering, in addition to researchers, chemists, and physicists.
    1 138,00 zł
    • Nowy
    The Load-pull Method of RF...

    The Load-pull Method of RF and Microwave Power Amplifier Design

    Autor: John Sevic
    Data wydania: 2020
    Using the load-pull method for RF and microwave power amplifier design This new book on RF power amplifier design, by industry expert Dr. John F. Sevic, provides comprehensive treatment of RF PA design using the load-pull method, the most widely used and successful method of design. Intended for the newcomer to load-pull, or the seasoned expert, the book presents a systematic method of generation of load-pull contour data, and matching network design, to rapidly produce a RF PA with first-pass success. The method is suitable from HF to millimeter-wave bands, discrete or integrated, and for high-power applications. Those engaged in design or fundamental research will find this book useful, as will the student new to RF and interested in PA design. The author presents
    530,00 zł
    • Nowy
    Wafer-level Testing and...

    Wafer-level Testing and Test During Burn-in for Integrated Circuits

    Autor: Krishnendu Chakrabarty
    Sudarshan Bahukudumbi
    Data wydania: 2010
    Wafer-level testing refers to a critical process of subjecting integrated circuits and semiconductor devices to electrical testing while they are still in wafer form. Burn-in is a temperature/bias reliability stress test used in detecting and screening out potential early life device failures. This hands-on resource provides a comprehensive analysis of these methods, showing how wafer-level testing during burn-in (WLTBI) helps lower product cost in semiconductor manufacturing. Engineers learn how to implement the testing of integrated circuits at the wafer-level under various resource constraints. Moreover, this unique book helps practitioners address the issue of enabling next generation products with previous generation testers. Practitioners also find expert
    417,90 zł
    • Nowy