Advances in Imaging and Electron Physics: Volume 163

Advances in Imaging and Electron Physics: Volume 163

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Features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in these domains.
30,00 zł
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Liczba stron:
248
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ISBN:
9780123813145
Features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in these domains.

Identification Of Historical Pigments In Wall Layers By Combination Of Optical And Scanning Electron Microscopy Coupled To Energy Dispersive Spectroscopy - A. Sever Skapin Optical interference near surfaces and its application in sub-wavelength microscopy - W. S. Bacsa Introduction of a Quantum of Time (\chronon"), and its Consequences for the Electron in Quantum and Classical Physicsy - Ruy H. A Farias and Erasmo RECAMI Superresolution Imaging - Revisited - Markus E. Testorf Methods and Limitations of Subwavelength Imaging Andrew Neice