Advances in Imaging and Electron Physics: Volume 161

Includes articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in different domains.

1. Charged particles in electromagnetic fields 2. Language of aberration expansions in charged particle optics 3. Transporting charged particle beams in static fields 4. Transporting charged particles in radiofrequency fields 5. Static magnetic charged particle analyzers 6. Electrostatic energy analyzers 7. Mass analyzers with combined electrostatic and magnetic fields 8. Time-of-flight mass analyzers 9. Radiofrequency mass analyzers